Model: TS268PARENU

Semiconductor Device Test Set

Properties:

Width
6.000 inches
Length
8.180 inches
Dc Voltage Rating
1.5 volts
Internal Battery Accommodation
Included
Material And Location
Aluminum housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Measurement of resistance and current
Operating Test Capability
Multimeter range 0 to 1 ma of ammeter range 0 to 10000 ohms of ohmeter
Height
3.620 inches
Nondefinitive Specification/std Data
Ts-268/u type
Fsc Application Data
Test set, semiconductor device
NSN
6625-00-557-0398
Part Number
TS268PARENU
Description
Test Set,semiconductor Device
CAGE
81349

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TS268PARENU NSN 6625-00-557-0398

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
KV
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
100.0
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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