Model: TS268BU

Semiconductor Device Test Set

Properties:

Width
5.750 inches
Length
7.500 inches
Electrical Power Source Relationship
Self-contained
Material And Location
Aluminum housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Measurement of resistance and current
Operating Test Capability
Res range 0 to 10 kilohms; current range 0 to 1 ma
Height
4.370 inches
NSN
6625-00-643-1075
Part Number
TS268BU
Description
Test Set,semiconductor Device
CAGE
80058

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TS268BU NSN 6625-00-643-1075

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
KV
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
8.3 X 8.3 X 4.5
Paclk Weight:
7.0000lbs
Item Weight:
0.0000lbs
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
F000004E12
SPI Rev.:
SPC Mkg:
19
LVL_A:
LVL_B:

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
653
TCC:
Z
SHC:
Q
ACC:
Equipment for Aircraft

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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