Model: TRACKER 4000
Semiconductor Device Test SetProperties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part TRACKER 4000 NSN 6625-01-469-3173
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPricing & Availability Check
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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