Model: TR210

Semiconductor Device Test Set

Special Features:

Built-in pulse generator

Properties:

Width
11.450 inches
Ac Voltage Rating
100.0 volts and 230.0 volts
Frequency Rating
60.0 hertz
Major Components
Tr210; instruction manual; one set atl25 test probes; common test leads; two mini-clip leads; u.S. Power cord
Depth
10.200 inches
End Application
Used with tds210 or tds 220 digital real time oscilloscopes
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Current voltage analog signature
Operating Test Capability
Test frequency 50 hz or 60 hz, 200 hz, 2, 000 hz; pulse generator 0 v to5 v
Phase
Two
Functional Description
Provides advanced troubleshooting capabilities to simplify testing of cmos and mos circuits; troubleshoots gate-fired scrs, triacs, and opto-couplers
Height
2.450 inches
NSN
6625-01-460-7146
Part Number
TR210
Description
Test Set,semiconductor Device
CAGE
57705

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TR210 NSN 6625-01-460-7146

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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