Model: TF30

Semiconductor Device Test Set

Properties:

Width
7.500 inches
Ac Voltage Rating
Between 105.0 volts and 130.0 volts
Depth
7.500 inches
Electrical Power Source Relationship
Operating
Material And Location
Steel housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Cricket gain; beta and transconductance leakage
Operating Test Capability
Beta range 0 to 500; gm range 0 to 25000 micro-ohms; leakage test range 0 to 2500 microamps; loss range 0 to 80 milliamps
Phase
Single
Functional Classification
Aa-9.3
Height
9.750 inches
Surface Treatment
Plastic
Supplementary Features
Manufacturers name: transistor test set
Surface Treatment
Plastic
NSN
6625-01-069-1282
Part Number
TF30
Description
Test Set,semiconductor Device
CAGE
33347

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TF30 NSN 6625-01-069-1282

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
RH
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
12.0 X 8.0 X 9.0
Paclk Weight:
9.0000lbs
Item Weight:
8.0000lbs
Item Dim:
011000730080
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
LVL_B:

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
658
TCC:
Z
SHC:
Z
ACC:
Equipment for Aircraft

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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