Model: PD02LEEC44
Semiconductor Device Test SetSpecial Features:
Supplied accessories will be: one pair of microprobes, common test leads, two mini-clip leads, power cord
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part PD02LEEC44 NSN 6625-01-500-3007
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsFreight Classification
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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