Model: JEM-200CX

Electronic Microscope

Properties:

General Description
Goniometer, side entry, 200.0 kv tilt capability, cut film; lab cathode electron gun; high resolution electron diffraction stage; back scattered eletron detector; bright/dark field stem image deflector; gamma control circuit; video control amplifier; scan rotation and tilt correction unit; tv scanning; multi-image display; free lens control; beam rocking micro diffraction unit; supplementary power supply
NSN
6650-01-187-2970
Part Number
JEM-200CX
Description
Microscope,electronic
CAGE
51043

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
TG
CRITL:
X

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