Model: JEM-100C/SEG

Electron Microscope

Properties:

General Description
Side entry goniometer 4.5 angstrom lattice or 7 angstrom point, 330x to 250000x magnification in 23 steps; cool beam electron gun, self-bias, pre-centered hairpin filament, automatic airlock and gun lift, horizontal and tilting control with balanced wo-stage beam deflector; double condenser lens, variable aperture on molybdenum plate, porm 6 degrees beam tilting angle; specimen chamber max of 6 specimens, built-in anticontamination device, crt specimen position indicator, porm 1 mm specimen movement; objective lens; double-stage intermediate and projector lenses; viewing chamber, 236 by 134 mm window built-in 10x binocutars and beam stopper; camera chamber 25 exposures, automatic or manual exposure control built-in data recording device; cascade vacuum system, pneumatic and electromagnetic valves, 2 oil rotary pumps 75 liter per min., 2 oil diffusion pumps 400liter per sec., cooling trap, 2 water -cooled baffles, pirani type gauges; accelerating voltage 20, 40, 60, 80, and 100 kv; 90x to 250000x magnifi
NSN
6650-01-013-9958
Part Number
JEM-100C/SEG
Description
Microscope,electron
CAGE

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

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