Model: 298-2320

Semiconductor Device Test Set

Special Features:

Built-in pulse generator

Properties:

Width
11.450 inches
Ac Voltage Rating
100.0 volts and 230.0 volts
Frequency Rating
60.0 hertz
Major Components
Tr210; instruction manual; one set atl25 test probes; common test leads; two mini-clip leads; u.S. Power cord
Depth
10.200 inches
End Application
Used with tds210 or tds 220 digital real time oscilloscopes
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Current voltage analog signature
Operating Test Capability
Test frequency 50 hz or 60 hz, 200 hz, 2, 000 hz; pulse generator 0 v to5 v
Phase
Two
Functional Description
Provides advanced troubleshooting capabilities to simplify testing of cmos and mos circuits; troubleshoots gate-fired scrs, triacs, and opto-couplers
Height
2.450 inches
NSN
6625-01-460-7146
Part Number
298-2320
Description
Test Set,semiconductor Device
CAGE
FA0Q5

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 298-2320 NSN 6625-01-460-7146

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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