Model: 2000B
Semiconductor Device Test SetSpecial Features:
Items are being coded as critical to insure source inspection will be performed at the point of manufacture, prior to material receipt by the us navy or other dod components. These items are piece parts or end items in support of vital military hardware necessary to sustain the successful mission of the ships, submarines, and shore stations of the us navy. Critical features including, but not limited to, dimensions, tolerances/clearances, electronic characteristics, and metallurgical properties will bespecified for government q ar (quality assurance representatives) to insure the highest possible degree of quality and reliability of these parts being delivered under navicp contracts
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part 2000B NSN 6625-01-391-4404
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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