Special Features:

Assembly of chassis assembly 1, test point assembly 1, nots assembly 1, connector panel 1, load bank assembly 1, card test assembly 1, relay assembly 1, computer assembly 1, computer assembly 1, printer assembly 1, crt assembly 1, keyboard assembly 1, power supply assembly 2, drawer assembly 3, fuse chassis assembly 1, fuse panel 1, inlet 2, oscilloscope 1, multimeter 1, power outlet box 1, bracket 5, panel 3, power dist assembly 1 modified shelf 1, basket assembly 1, grounding bus 1, grounding strap 3, paper support 1, cable assembly 30, clamp 1, tie cable 1, modified cable carrier 1, strap 1, bushing 2 and related hardware

Properties:

A test set specifically designed for making examinations of guided missile system, including electronic components and circuits. Excludes individual test sets designed for a single specific function. Excludes test set, electronic systems.