Model: XDS-560V2

Electronic Systems Test Set

Special Features:

Power over usb; additional dedicated led's; lan and usb graphical configuration and diagnostic tool; flexible 12.5 inch cable; includes 20-pin compact ti (cti), 14-pin standard ti and 20-pin arm adapters; auto-adaptable tclock up to 50mhz; auto-sensing target voltage range from 1.2-4.1 volt; jtag debug isolation; up to 100 mhz export clock; auto compensating calibration; adaptive receiver for setup/hold times up to 1.5ns; supports jtag 1149.1 and 1149.7, 1-4 pin system trace with 128 mb of system trace buffer, mobile industry processor interface system trace protocol and high speed parallel trace

Properties:

Test Type For Which Designed
System trace for ti devices
NSN
6625-01-620-1148
Part Number
XDS-560V2
Description
Test Set,electronic Systems
CAGE

A test set specifically designed for use in making examinations and providing discrete evaluations of the over-all performance of a system(s) or subsystem(s). Excludes test set (1), antenna system; test set (1), fire control system; test set (1), flight control system; and test set (1), telemetering system.

Part XDS-560V2 NSN 6625-01-620-1148

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
61201
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
2
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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