Model: TS268EU

Semiconductor Device Test Set

Properties:

Width
6.000 inches
Length
8.187 inches
Internal Battery Accommodation
Included
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Front resistance of crystal; back resistance of crystal; back current of crystal
Operating Test Capability
Front resistance-not greater than 0.5 kilohm for a good crystal; back resistance-ratio of back to front resistance greater than 10 to 1 for a good crystal; back current-crystal should not indicate current greater than - crystal in21 and in23, in23a, in25, in21a and in23b, in21b, in26 we, in26 syl, in78 syl - current d. C. 0.400 ma, 0.300 ma, 0.250 ma, 0.175 ma, 0.125 ma, 0.110 ma, 0.230 ma, 0.160 ma
Height
3.625 inches
NSN
6625-00-923-6534
Part Number
TS268EU
Description
Test Set,semiconductor Device
CAGE
94518

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TS268EU NSN 6625-00-923-6534

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
RATING VARIABLE
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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