Model: TS1100AU
Semiconductor Device Test SetSpecial Features:
Transistor under test does not have to be removed from circuit for test
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part TS1100AU NSN 6625-00-580-4166
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
Pricing & Availability Check
Submit this form for stock availability and pricing.How to Order
Ordering from buyaircraftparts.comIf you would like to order this semiconductor device test set (NSN 6625-00-580-4166)
please submit the pricing and availability form above to receive an up to date quote by email.
If you agree to the pricing and terms you can e-sign your order online!
We are pleased to have the opportunity to serve you.
Have a Question
Hours: | 08:00-18:00 Eastern Standard Time |
Phone: | +1 470-231-0824 |
Email: | Contact Form » |
Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
Highest Rated Parts
-
101KIT2029 Explosive Backpack
NSN 1385-01-625-5195
-
300-2-75-400 Hose Clamp
NSN 4730-00-537-3326
-
AE10288 Radio Frequency Cable Assembly
NSN 5995-01-377-8218
-
74A324672-2003 Plastic Strip
NSN 9330-01-263-0227
Recently Purchased Parts
-
X5008/12/156/99 Machine Key
NSN 5315-01-290-4125
-
MS16536-31 Tubular Rivet
NSN 5320-01-229-8182
-
09A074M01A17A06 Tapered Spacer
NSN 5365-01-347-1330
-
T160106 General Purpose Resilient Mount
NSN 5340-01-474-7734
Hot Parts
-
PL1976599 FIND 6 Circuit Card Assembly
NSN 5998-01-053-3894
-
Y258 Crimping Tool Die
NSN 5120-01-359-6246
-
12W661-2 Air Structural Component Support
NSN 1560-01-369-7632
-
MS24616-25 Tapping Screw
NSN 5305-00-052-8897