Model: TS1100AU
Semiconductor Device Test SetSpecial Features:
Transistor under test does not have to be removed from circuit for test
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part TS1100AU NSN 6625-00-580-4166
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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