Model: TS-3253/TPM-39

Semiconductor Device Test Set

Properties:

Width
4.250 inches
Length
5.500 inches
Joint Electronics Type Designation System Item Name
Test set, semiconductor device
Joint Electronics Type Designation System Item Type Number
Ts-3253/tpm-39
Material And Location
Aluminum housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Microwave diode current
Operating Test Capability
Microamphere meter range 0-1000 ua dc
Height
3.880 inches
Surface Treatment
Enamel
Surface Treatment
Enamel
Fsc Application Data
Test set, elect. Equip.
NSN
6625-00-222-1117
Part Number
TS-3253/TPM-39
Description
Test Set,semiconductor Device
CAGE
80058

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part TS-3253/TPM-39 NSN 6625-00-222-1117

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
3.7000lbs
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
Q
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
--
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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