Model: ST2954
Semiconductor Device Test SetProperties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part ST2954 NSN 6625-00-724-8444
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
Pricing & Availability Check
Submit this form for stock availability and pricing.How to Order
Ordering from buyaircraftparts.comIf you would like to order this semiconductor device test set (NSN 6625-00-724-8444)
please submit the pricing and availability form above to receive an up to date quote by email.
If you agree to the pricing and terms you can e-sign your order online!
We are pleased to have the opportunity to serve you.
Have a Question
Hours: | 08:00-18:00 Eastern Standard Time |
Phone: | +1 470-231-0824 |
Email: | Contact Form » |
Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
Highest Rated Parts
-
RELEASE2590 Transistor
NSN 5961-00-958-1638
-
10867236 Nonskid Metallic Tread
NSN 2510-00-168-2229
-
142178-1 Electronic Test Extender Card
NSN 5998-01-322-8281
-
75D410006-1001 Electrical Cable Assembly-switch
NSN 6150-01-461-9993
Recently Purchased Parts
-
702181-105 Paper Metallized Fixed Capacitor
NSN 5910-01-132-1336
-
20C05 Reactor
NSN 5950-01-129-3043
-
M5814 Fairlead Roller Cover
NSN 2090-01-519-5864
-
SP1185 O Strainer Assembly
NSN 2945-00-774-9999
Hot Parts
-
09-158245-1 Microcircuit Progra
NSN 5962-01-212-3291
-
624292-1 Circuit Card Assembly
NSN 5998-01-334-6966
-
JAN1N4249 Diode Semiconductor Device
NSN 5961-00-469-9970
-
921R397 Mica Dielectric Fixed Capacitor
NSN 5910-00-101-5783