Model: SERIES10

Semiconductor Device Test Set

Special Features:

Video keyboard terminal; porm 2 pct acuracy; power supply m7.0 v-p15.0 v, test rate 10-20 mhz; clock rate 30 mhz; m10 v-p20 v, 300 ma power supply; capacitance 15-20 pf; load current: dcporm 20 ma, ac porm 80 ma; max cpu memory 256k ecc; floppy disc; output mag tape/line printer; storage 200 kbytes; ieee 488 buss

Properties:

Test Type For Which Designed
Pulse, time interval, current, voltage
NSN
6625-01-263-4525
Part Number
SERIES10
Description
Test Set,semiconductor Device
CAGE
25677

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part SERIES10 NSN 6625-01-263-4525

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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