Special Features:

Semiconductor wafer inspection lamp with yellow filter, 100 watt bulb & 8 ft primary & secondary cord

Properties:

An item specifically designed for use in determining the existence of seams, cracks and other types of flaws in metals. It consists of an ultraviolet light source such as a mercury-vapor lamp, in a housing usually incorportating a pistol-grip handle, and a filter for the exclusion of visible light. See also detector, metal flaw, electronic.