Model: S-110

Electronic Systems Test Set

Properties:

Major Components
Current source; current monitor; voltmeter; switching/amplifier module; cabinet; rack mounting kits; cables; power control panel; software of ibm pcsingle user license
Inclosure Feature
Multiple item w/housing
Test Type For Which Designed
Hall effect resistivity/mobility measurements in bar and wafer samples of gallium and other compounds
NSN
6625-01-321-4679
Part Number
S-110
Description
Test Set,electronic Systems
CAGE
80164

A test set specifically designed for use in making examinations and providing discrete evaluations of the over-all performance of a system(s) or subsystem(s). Excludes test set (1), antenna system; test set (1), fire control system; test set (1), flight control system; and test set (1), telemetering system.

Part S-110 NSN 6625-01-321-4679

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
61201
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
2
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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