Model: R-4000A

Semiconductor Device Test Set

Special Features:

Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports

Properties:

Width
12.250 inches
Ac Voltage Rating
Between 85.0 volts and 250.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Depth
12.250 inches
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Impedance range: 100k, 10k, 1k, and 100 ohms; test frequencies: 60, 2000 hz sinewave
Phase
Single
Functional Description
General purpose troubleshooting system designed to test a variety of electronic circuits using menu driven software
Height
3.000 inches
NSN
6625-01-380-3727
Part Number
R-4000A
Description
Test Set,semiconductor Device
CAGE
34344

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part R-4000A NSN 6625-01-380-3727

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
100.0
WCC:
72D
TCC:
Z
SHC:
9
ACC:
Equipment for Aircraft

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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