Model: PL5010

Semiconductor Device Test Set

Special Features:

Tests most types of ttl and cmos digital ics; accessories supplies are instruction manual, ic library list, ak-5010 user library software and hardware, power cord, in-circuit ic test clip and cable for 14, 16, 20, 24, and 28-pin ic's, eeprom for learned test routines, ground cable, spare fuse

Properties:

Width
12.500 inches
Length
17.000 inches
Ac Voltage Rating
100.0 volts or 120.0 volts or 200.0 volts or 240.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Fault isolation of ic's
Phase
Single
Height
5.500 inches
NSN
6625-01-362-3839
Part Number
PL5010
Description
Test Set,semiconductor Device
CAGE
08098

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part PL5010 NSN 6625-01-362-3839

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
--
WCC:
72D
TCC:
Z
SHC:
9
ACC:
Trailers/Vehicles

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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