Model: MIL-HDBK-300(PME)

Semiconductor Device Test Set

Properties:

Width
11.100 inches
Ac Voltage Rating
100.0 volts or 115.0 volts or 230.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Depth
8.500 inches
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Resistance, capacitance, inductance
Operating Test Capability
Frequencies 20, 50, 60, 200, 500, and 2khz; voltages 200milli, 3, 5, 10, 15, and 20v; resistance 10, 50, 100, 500, 1k, 5k, 10k, 50k, 100k ohms
Phase
Single
Functional Classification
Aa-1.3
Functional Description
Used to test passive devices, diodes, transistors, gated devices, optoelectronic devices, and integrated circuits
Height
4.400 inches
Entry Date
10-01-14
Relationship To Similar Equipment
Tracker 2800s can scan multi-pin
NSN
6625-01-581-4169
Part Number
MIL-HDBK-300(PME)
Description
Test Set,semiconductor Device
CAGE
1HBK1

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part MIL-HDBK-300(PME) NSN 6625-01-581-4169

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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