Model: MIL-HDBK-300(ATS)

Semiconductor Device Test Set

Special Features:

Meets mil-prf-28800 class 3

Properties:

Ac Voltage Rating
110.0 volts or 240.0 volts
Frequency Rating
Between 50.0 hertz and 400.0 hertz
Major Components
Test set; pair microprobes; common test leads; shrouded test lead; power cord; cd manual
Accessory Component Quantity
5
Electrical Power Source Relationship
Operating
Internal Battery Accommodation
Not included
Inclosure Feature
Single item w/housing
Test Type For Which Designed
In-circuit electronic component testing
Part Name Assigned By Controlling Agency
Test set, semiconductor
Phase
Single
Functional Classification
Aa-9.6
Functional Description
Used to in-circuit test semiconductor components
Entry Date
09-09-08
Purchase Description Identification
98752-pd09wrgbec24
NSN
6625-01-577-7189
Part Number
MIL-HDBK-300(ATS)
Description
Test Set,semiconductor Device
CAGE

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part MIL-HDBK-300(ATS) NSN 6625-01-577-7189

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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