Model: HTR1005B-1ES

Semiconductor Device Test Set

Properties:

Width
250.0 millimeters
Ac Voltage Rating
220.00 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Depth
286.0 millimeters
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
In-circuit testing of componets
Height
86.0 millimeters
NSN
6625-01-216-3258
Part Number
HTR1005B-1ES
Description
Test Set,semiconductor Device
CAGE
57705

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part HTR1005B-1ES NSN 6625-01-216-3258

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

Pricing & Availability Check

Submit this form for stock availability and pricing.
Part Number:
Quantity:
Email Address:
Phone Number:
Your Name:
Company:



Privacy Policy    Terms & Conditions

How to Order  

Ordering from buyaircraftparts.com

If you would like to order this semiconductor device test set (NSN 6625-01-216-3258) please submit the pricing and availability form above to receive an up to date quote by email. If you agree to the pricing and terms you can e-sign your order online!

We are pleased to have the opportunity to serve you.

Have a Question

Hours: 08:00-18:00 Eastern Standard Time
Phone: +1 470-231-0824
Email: Contact Form »
Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

Highest Rated Parts
Recently Purchased Parts
Hot Parts