Model: HTR1000

Semiconductor Device Test Set

Properties:

Width
9.000 inches
Length
11.000 inches
Ac Voltage Rating
Between 115.0 volts and 230.0 volts
Electrical Power Source Relationship
Operating
Test Type For Which Designed
Will detect leakage, bonding problems, shorts, opens and unusual failure modes
Height
4.000 inches
NSN
6625-01-316-6512
Part Number
HTR1000
Description
Test Set,semiconductor Device
CAGE
57705

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part HTR1000 NSN 6625-01-316-6512

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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