Model: F178703 ITEM 30
Semiconductor Device Test SetProperties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part F178703 ITEM 30 NSN 6625-01-644-5784
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsFreight Classification
Pricing & Availability Check
Submit this form for stock availability and pricing.How to Order
Ordering from buyaircraftparts.comIf you would like to order this semiconductor device test set (NSN 6625-01-644-5784)
please submit the pricing and availability form above to receive an up to date quote by email.
If you agree to the pricing and terms you can e-sign your order online!
We are pleased to have the opportunity to serve you.
Have a Question
Hours: | 08:00-18:00 Eastern Standard Time |
Phone: | +1 470-231-0824 |
Email: | Contact Form » |
Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
Highest Rated Parts
-
AS4310K06 Tube To Boss Tee
NSN 4730-01-013-9790
-
BB437-1A Bearing Ball
NSN 3110-00-100-6156
-
25-0312-12 Light Lens
NSN 6210-01-076-4592
-
1006Z421 Vehicular Shifter Fork
NSN 2520-00-734-7598
Recently Purchased Parts
-
CD4077BF/3A Digital Microcircuit
NSN 5962-01-219-6292
-
22074-000 Telephone Connecting Station
NSN 5805-01-090-0325
-
248042 Bushing
NSN 3120-00-235-4812
-
BACB30LU4-2 Close Tolerance Screw
NSN 5305-01-097-8941
Hot Parts
-
921-1602-0051 Electrolytic Fixed Capacitor
NSN 5910-00-824-3976
-
3366473 Circuit Card Assembly
NSN 5998-01-242-9751
-
54-750 Compression Helical Spring
NSN 5360-00-248-4754
-
1531-4000 Paper Dielectric Fixed Capacitor
NSN 5910-00-161-2900