Model: AFIT3000A

Semiconductor Device Test Set

Special Features:

A master library disc containing individual truth table data for ic's in the ttl, dtl, & cmos logic families is included

Properties:

Ac Voltage Rating
115.0 volts
Frequency Rating
60.0 hertz
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Integrated circuit fault isolation
Phase
Single
Supplementary Features
Manufacturers name: digital pcb test system
NSN
6625-01-076-7916
Part Number
AFIT3000A
Description
Test Set,semiconductor Device
CAGE
51089

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part AFIT3000A NSN 6625-01-076-7916

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
49.0 X 33.0 X 38.0
Paclk Weight:
309.0000lbs
Item Weight:
0.0000lbs
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
03
LVL_A:
LVL_B:

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
658
TCC:
Z
SHC:
Z
ACC:
Equipment for Aircraft

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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