Model: 99-0375

Semiconductor Device Test Set

Special Features:

I6 peak voltages 200 mv, 3, 5, 10, 15, 20 volts; resistance 10, 100 ohms and 1, 10, and 100 kohms; 2 channel; scan manual or automatic; power 40 watts; color lcd; weight 6 lbs; operating temp is 32 to 104 degf

Properties:

Width
11.500 inches
Ac Voltage Rating
115.0 volts or 230.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Major Components
Tracker; microprobes; common test leads; 20 and 40 pin dip clips; blue clip lead; power cord; instruction cd
Depth
10.800 inches
Electrical Power Source Relationship
Operating
Internal Battery Accommodation
Not included
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Power-off; low voltage logic circuitry
Operating Test Capability
5 test frequencies 20, 50, 60, 200, 2000 hz
Phase
Single
Height
4.500 inches
NSN
6625-01-527-4507
Part Number
99-0375
Description
Test Set,semiconductor Device
CAGE
57705

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 99-0375 NSN 6625-01-527-4507

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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