Model: 914F536-1
Semiconductor Device Test SetProperties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part 914F536-1 NSN 6625-00-933-5188
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
Pricing & Availability Check
Submit this form for stock availability and pricing.How to Order
Ordering from buyaircraftparts.comIf you would like to order this semiconductor device test set (NSN 6625-00-933-5188)
please submit the pricing and availability form above to receive an up to date quote by email.
If you agree to the pricing and terms you can e-sign your order online!
We are pleased to have the opportunity to serve you.
Have a Question
Hours: | 08:00-18:00 Eastern Standard Time |
Phone: | +1 470-231-0824 |
Email: | Contact Form » |
Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
Highest Rated Parts
-
101446 Guide Bracket
NSN 5342-00-166-5212
-
AM9128-15 Memory Microcircuit
NSN 5962-01-159-7878
-
CCP-2504-MP Electrical-electro Control Panel
NSN 6110-01-566-0024
-
69-1968-2 Nlg Lock Arm-shaft
NSN 1620-01-019-0115
Recently Purchased Parts
-
NAS6205-34 Shear Bolt
NSN 5306-01-151-9287
-
K753 75573 Mc&g Products Topo
NSN 7643-01-404-1763
-
139-3550 Gasket
NSN 5330-01-564-6999
-
223703 Hexagon Head Cap Screw
NSN 5305-00-022-3703
Hot Parts
-
169576PC412 Compression Helical Spring
NSN 5360-00-291-7062
-
674370C91 Sleeve Bearing Set
NSN 3120-01-023-1911
-
0590004 Wire Rope
NSN 4010-01-605-3821
-
DD445S4200-27 Speed Decreaser Gear Assembly
NSN 3010-00-222-4352