Model: 4145A

Semiconductor Device Test Set

Properties:

Width
16.750 inches
Ac Voltage Rating
100.0 volts and 120.0 volts and 220.0 volts and 240.0 volts
Frequency Rating
Between 48.0 hertz and 66.0 hertz
Major Components
Semiconductor parameter analyzer 1; plug-in module 7
Depth
24.100 inches
Electrical Power Source Relationship
Operating
Internal Battery Accommodation
Not included
Inclosure Feature
Multiple item w/housing
Test Type For Which Designed
Stimulates voltage & current sensitive devices & measures resulting current & voltage responses
Operating Test Capability
Voltage 3 ranges: porm 100 volts; current 9 ranges porm 100 milliamps
Functional Classification
Aa-9.6
Height
9.060 inches
Entry Date
92-07-15
NSN
6625-01-192-7577
Part Number
4145A
Description
Test Set,semiconductor Device
CAGE
1LQK8

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 4145A NSN 6625-01-192-7577

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
--
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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