Model: 3

Semiconductor Device Test Set

Properties:

Width
6.000 inches
Length
9.000 inches
Dc Voltage Rating
13.5 volts
Major Components
Adapter, transistor
Accessory Component Quantity
1
Accessory Controlling Agency
Test equipment corp
Accessory Identifying Number
Ta-1 part no.
Internal Battery Accommodation
Included
Material And Location
Aluminum carrying case
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Ac current gain; saturation; leakage current
Operating Test Capability
Ac current gain range 3 to 100 and 30 to 1000, ac test freq 1 khz porm 10 pct of total; saturation voltage range 0.3 to 3v full scale; leakage current range 0.03, 0.3, 3 or 30 ma full scale at 6v
Height
6.000 inches
NSN
6625-00-926-1341
Part Number
3
Description
Test Set,semiconductor Device
CAGE
24623

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 3 NSN 6625-00-926-1341

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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