Model: 390

Semiconductor Device Test Set

Properties:

Width

6.000 inches

Length

8.180 inches

Dc Voltage Rating

1.5 volts

Internal Battery Accommodation

Included

Material And Location

Aluminum housing

Inclosure Feature

Single item w/housing

Test Type For Which Designed

Measures reverse current checks crystal units for good o bad under basic tests

Operating Test Capability

Measures reverse current, checks crystal units for good r bad under basic tests

Height

3.620 inches

NSN

6625-00-553-8155

Part Number

390

Description

Test Set,semiconductor Device

CAGE

00752

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 390 NSN 6625-00-553-8155

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

320.0000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

F000001B12

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

77.5

WCC:

653

TCC:

SHC:

ACC:

Equipment for Aircraft

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Schedule B and Export

Schedule B: 9030908030
SITC: 87479
End Use: Measuring, testing, control instruments
NAICS: 334515
USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39