Model: 370-1P

Semiconductor Device Test Set

Special Features:

7 inch diag crt; 16v, 80v, 400v, 2000v ranges

Properties:

Width
16.900 inches
Ac Voltage Rating
115.0 volts
Frequency Rating
60.0 hertz
Depth
25.100 inches
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Electrostatic discharge of electrical overstress of integrated circuits
Phase
Single
Height
13.100 inches
Surface Treatment
Any acceptable
NSN
6625-01-258-7065
Part Number
370-1P
Description
Test Set,semiconductor Device
CAGE
80009

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 370-1P NSN 6625-01-258-7065

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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