Model: 3490

Semiconductor Device Test Set

Special Features:

Mfg name-transistor analyzer

Properties:

Width
19.000 inches
Ac Voltage Rating
110.0 volts
Frequency Rating
60.0 hertz
Depth
15.000 inches
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Power and signal
Phase
Single
Functional Description
Analyzes transistors in either comon base or common emitter config
Height
8.000 inches
Supplementary Features
Portable; 3 independent power suppliesent power supplies; collector currents to 10 amperes; input currents to 1 ampere; separate input and collector meters
NSN
6625-00-953-8196
Part Number
3490
Description
Test Set,semiconductor Device
CAGE

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 3490 NSN 6625-00-953-8196

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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