Model: 3490-A

Semiconductor Device Test Set

Special Features:

Mfg name-transistor analyzer

Properties:

Width
19.000 inches
Ac Voltage Rating
110.0 volts
Frequency Rating
60.0 hertz
Depth
15.000 inches
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Power and signal
Phase
Single
Functional Description
Allows plotting of transistor characteristic curves; any type of transistor test
Height
8.000 inches
Supplementary Features
Portable; leakage read down to 100 nanoamperes; continuous current
NSN
6625-01-044-7748
Part Number
3490-A
Description
Test Set,semiconductor Device
CAGE
60741

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 3490-A NSN 6625-01-044-7748

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
A
ESD:
A
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
200.0
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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