Model: 3110

Semiconductor Device Test Set

Properties:

Width
250.0 millimeters
Ac Voltage Rating
115.0 volts
Frequency Rating
60.0 hertz
Depth
286.0 millimeters
End Application
Nsn 5826-00-117-7747 calibration bench mock up
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
In-circuit testing of components
Phase
Single
Height
86.0 millimeters
NSN
6625-01-152-1697
Part Number
3110
Description
Test Set,semiconductor Device
CAGE
34160

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 3110 NSN 6625-01-152-1697

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
RH
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
2.0000lbs
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
SPI Rev.:
SPC Mkg:
03
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
RATING VARIABLE
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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