Model: 2700S MIL
Semiconductor Device Test SetSpecial Features:
Wave form: sine wave. Channels (2), 40 pins/channel
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part 2700S MIL NSN 6625-01-529-5140
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsPackaging & Shipping
Freight Classification
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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