Model: 198011P1

Photo Semiconductor Device
Description:

Junction contact internal configuration, silicon semiconductor material, 15.0 peak positive gate voltage voltage rating in volts per characteristic.

Special Features:

Junction pattern arrangement: pnpn

Properties:

Internal Configuration
Junction contact
Semiconductor Material
Silicon
Voltage Rating In Volts Per Characteristic
15.0 peak positive gate voltage
Terminal Type And Quantity
3 uninsulated wire lead
NSN
5961-00-067-9136
Part Number
198011P1
Description
Semiconductor Device,photo
CAGE
94117

A semiconductor device (1) which is responsive to visible or infrared radiant energy. May or may not include mounting hardware and/or heat sink. Excludes semiconductor device (1), diode; semiconductor device (1), thyristor and transistor. For solid state devices which emit visible or infrared radiant energy, see light emitting diode.

Part 198011P1 NSN 5961-00-067-9136

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20587
FIIG:
A110A0
Concept No.:
1
App. Key:
C
Cond. Code:
2
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
--
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
Q
LVL_B:
Q

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Schedule B and Export
  • Schedule B: 8541409500
  • SITC: 77637
  • End Use: Semiconductors
  • NAICS: 334413
  • USDA: 1

Freight Class: Photosensitive semiconductor devices, nesoi

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