Model: 19301

Diffraction Pat Measuring Device

Properties:

General Description
C/o densitometer and recorder; determins rate of d spacings from electron and x-ray diffraction patterns; automatically produces permanent expanded chart record of variations in film density along selected track; chart may be read to line spacing of between 0.05 and 0.10 mm for d value determinations; outer support ring has 360 degrees protractor scale; bench sz 44 x 16 in.
NSN
6650-01-250-1243
Part Number
19301
Description
Measuring Device,diffraction Pat
CAGE
22741

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
058110
UFC:
33110
LTL:
200.0
LCL:
77.5
WCC:
732
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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