Model: 1731-9700

Semiconductor Device Test Set

Special Features:

Display includes both pass/fail led and a range of video display modes; includes keyboard and mass storage; rs232 and ieee-488 interfaces

Properties:

Width
19.000 inches
Ac Voltage Rating
110.0 volts and 125.0 volts and 216.0 volts and 250.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Depth
25.000 inches
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Microcomputer controlled ram based test system for high throughput testing of the full range of linear devices
Height
12.500 inches
Supplementary Features
Manufacturers name: linear ic test system
NSN
6625-01-257-5258
Part Number
1731-9700
Description
Test Set,semiconductor Device
CAGE
24655

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 1731-9700 NSN 6625-01-257-5258

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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