Model: 120

Semiconductor Device Test Set

Properties:

Inclosure Feature

Single item w/housing

Test Type For Which Designed

Measurement of transistors

Functional Classification

Aa-9.3

Supplementary Features

Manufacturers name: transistor test set

NSN

6625-00-367-9323

Part Number

120

Description

Test Set,semiconductor Device

CAGE

51089

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 120 NSN 6625-00-367-9323

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

200.0000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

77.5

WCC:

72D

TCC:

SHC:

ACC:

Equipment for Aircraft

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Schedule B and Export

Schedule B: 9030908030
SITC: 87479
End Use: Measuring, testing, control instruments
NAICS: 334515
USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39