Model: 0M6009SAT

Transistor

Properties:

Inclosure Material
Metal
Overall Length
Between 0.790 inches and 0.800 inches
Overall Height
Between 0.249 inches and 0.260 inches
Overall Width
Between 0.535 inches and 0.545 inches
Mounting Facility Quantity
1
Internal Configuration
Field effect
Joint Electronic Device Engineering Council/jedec/case Outline Designation
To-254
Mounting Method
Terminal and unthreaded hole
Semiconductor Material
Silicon
Voltage Rating In Volts Per Characteristic
100.0 breakdown voltage, drain-to-source, with all other terminals short-circuited to source and 20.0 gate to source voltage
Current Rating Per Characteristic
22.00 amperes drain current and 88.00 amperes off-state current, peak
Power Rating Per Characteristic
125.0 watts total device dissipation
Maximum Operating Tempurature Per Measurement Point
150.0 degrees celsius junction
Special Test Features
Environmental stress screening
Test Data Document
08748-tr162 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing) and 08748-tr169 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)
Terminal Type And Quantity
3 uninsulated wire lead
NSN
5961-01-381-8867
Part Number
0M6009SAT
Description
Transistor
CAGE
69210

An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes semiconductor device, diode and semiconductor device, thyristor. For solid state devices which are responsive to visible or infrared radiant energy, see semiconductor device, photo.

Part 0M6009SAT NSN 5961-01-381-8867

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20588
FIIG:
A110A0
Concept No.:
App. Key:
D
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
B
ESD:
B
MMAC:
EH
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
--
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
SPI Rev.:
SPC Mkg:
ZZ
LVL_A:
Q
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
063025
UFC:
34525
LTL:
RATING VARIABLE
LCL:
--
WCC:
72D
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 8541500080
  • SITC: 77639
  • End Use: Semiconductors
  • NAICS: 334413
  • USDA: 1

Freight Class: Semiconductor devices, nesoi

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