Model: 039110

Semiconductor Device Test Set

Properties:

Width
6.500 inches
Length
6.250 inches
Electrical Power Source Relationship
Self-contained
Material And Location
Aluminum housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
In circuit test of noise figure, tests for match pair selection
Height
3.250 inches
Surface Treatment
Enamel
Surface Treatment
Enamel
NSN
6625-00-103-2679
Part Number
039110
Description
Test Set,semiconductor Device
CAGE

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part 039110 NSN 6625-00-103-2679

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Material Classification

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
TG
CRITL:
N

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
7.0 X 7.0 X 4.0
Paclk Weight:
3.0000lbs
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
SPI Rev.:
SPC Mkg:
03
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
RATING VARIABLE
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Schedule B and Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Freight Class: Parts and accessories of articles of schedule b subheading 9030.39

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